Search Results for Reliability.

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Circuit Design for Reliability

Yazar

Reis, Ricardo. editor.

http://dx.doi.org/10.1007/978-1-4614-4078-9

Format:

Electronic Resources

Alıntı:

Circuit Design for Reliability Reis, Ricardo. editor.

Advances in Reliability and System Engineering

Yazar

Ram, Mangey. editor.

https://doi.org/10.1007/978-3-319-48875-2

Format:

Electronic Resources

Alıntı:

Quality Control, Reliability, Safety and Risk. http://scigraph.springernature.com/things/product

Semiconductor Power Devices Physics, Characteristics, Reliability

Yazar

Lutz, Josef. author.

https://doi.org/10.1007/978-3-319-70917-8

Format:

Electronic Resources

Alıntı:

Semiconductor Power Devices Physics, Characteristics, Reliability / Lutz, Josef. author.

CMOS RF Circuit Design for Reliability and Variability

Yazar

Yuan, Jiann-Shiun. author.

http://dx.doi.org/10.1007/978-981-10-0884-9

Format:

Electronic Resources

Alıntı:

CMOS RF Circuit Design for Reliability and Variability Yuan, Jiann-Shiun. author.

Solid State Lighting Reliability Part 2 Components to Systems

Yazar

van Driel, Willem Dirk. editor.

https://doi.org/10.1007/978-3-319-58175-0

Format:

Electronic Resources

Alıntı:

Solid State Lighting Reliability Part 2 Components to Systems / van Driel, Willem Dirk. editor.

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization

Yazar

Richter, Detlev. author.

http://dx.doi.org/10.1007/978-94-007-6082-0

Format:

Electronic Resources

Alıntı:

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization / Richter

Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability

Yazar

El-Kareh, Badih. author.

http://dx.doi.org/10.1007/978-1-4939-2751-7

Format:

Electronic Resources

Alıntı:

Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability /

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Yazar

Franco, Jacopo. author.

http://dx.doi.org/10.1007/978-94-007-7663-0

Format:

Electronic Resources

Alıntı:

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Franco, Jacopo

Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability

Yazar

Lee, Tae-Kyu. author.

http://dx.doi.org/10.1007/978-1-4614-9266-5

Format:

Electronic Resources

Alıntı:

Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability / Lee

10.

High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

Yazar

Wang, Zheng. author.

https://doi.org/10.1007/978-981-10-1073-6

Format:

Electronic Resources

Alıntı:

High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip Wang, Zheng

11.

Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthday

Yazar

Fiondella, Lance. editor.

http://dx.doi.org/10.1007/978-3-319-30599-8

Format:

Electronic Resources

Alıntı:

Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi

12.

VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Yazar

Shin, Youngsoo. editor.

http://dx.doi.org/10.1007/978-3-319-46097-0

Format:

Electronic Resources

Alıntı:

VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International

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