Materials and Processes for Spacecraft and High Reliability Applications / D. Dunn, Barrie. author.

Solid State Lighting Reliability Part 2 Components to Systems / van Driel, Willem Dirk. editor.

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization / Richter

Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability /

Quality Control, Reliability, Safety and Risk. http://scigraph.springernature.com/things/product

Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles / Nakagawa

Current Trends in Reliability, Availability, Maintainability and Safety An Industry Perspective /

Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems / Kadry

Reliability and Availability of Quality Control Based on Wavelet Computer Vision Kuzmanić, Ivica

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Franco, Jacopo

This book discusses the application of quality and reliability engineering in Asian industries, and offers information for multinational companies (MNC) looking to transfer some of their operation and manufacturing capabilities to Asia and at the same time maintain high levels of reliability and quality. It is also provides small and medium enterprises (SME) in Asia with insights into producing high-quality and reliable products. It mainly comprises peer-reviewed papers that were presented at the Asian Network for Quality (ANQ) Congress 2014 held in Singapore (August, 2014), which provides a platform for companies, especially those within Asia where rapid changes and growth in manufacturing are taking place, to present their quality and reliability practices. The book presents practical demonstrations of how quality and reliability methodologies can be modified for the unique Asian market, and as such is a valuable resource for students, academics, professionals and practitioners in the field of quality and reliability.

Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability / Lee