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Yazar
Sharma, Ashok K., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562
Format:
Electronic Resources
Alıntı:
Semiconductor Memories: Technology, Testing, and Reliability, the author's earlier work, Advanced Semiconductor
Yazar
Popek, Gerald.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267466
Format:
Electronic Resources
Alıntı:
transparent, distributed operation, LOCUS features also include high performance and reliability; full Unix
Yazar
Brown, William D., 1943-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263046
Format:
Electronic Resources
Alıntı:
(H. Naseem). Materials and Processing Considerations (S. Ang & W. Brown). Reliability Considerations
Yazar
Schroder, Dieter K., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928
Format:
Electronic Resources
Alıntı:
spreading resistance, and ballistic electron emission microscopy.. Reliability and Failure Analysis examines
Yazar
Tian, Jeff, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5988897
Format:
Electronic Resources
Alıntı:
-- Software reliability engineering.
Yazar
Ulrich, Richard Kevin, 1955-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769522
Format:
Electronic Resources
Alıntı:
: Packaging of MEMS and MOEMS: challenges and a case study. -- Chapter 16: Reliability considerations
Yazar
Barker, Robert J.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769526
Format:
Electronic Resources
Alıntı:
that are dramatically increasing the compactness, efficiency, cost-effectiveness, and reliability of
Yazar
Chandrakasan, Anantha P.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266000
Format:
Electronic Resources
Alıntı:
(Stefanos Sidropoulos, Chih-Kong Ken Yang, and Mark Horowitz). RELIABILITY. Electromigration Reliability (J
Yazar
Stoft, Steven, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264048
Format:
Electronic Resources
Alıntı:
: Reliability, Price Spikes and Investment. -- Reliability and Investment Policy. -- Price Spikes Recover Fixed
Yazar
Segura, Jaume, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237599
Format:
Electronic Resources
Alıntı:
important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and
Yazar
Singh, Raminderpal.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273263
Format:
Electronic Resources
Alıntı:
for Electromigration Reliability -- Power Dissipation Analysis and Optimization of Deep Submicron CMOS
Yazar
Zigangirov, K. Sh, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237086
Format:
Electronic Resources
Alıntı:
Shannon Capacity of DS CDMA Systems -- 8.2 Reliability Functions -- 8.3 Capacity of FH CDMA Systems -- 8.4
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