38 sonuç bulundu Arama sonuçlarına abone ol
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13. 
Bias Temperature Instability for Devices and Circuits için kapak resmi
Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Yazar 
Grasser, Tibor. editor.
http://dx.doi.org/10.1007/978-1-4614-7909-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
14. 
Embedded Systems Design for High-Speed Data Acquisition and Control için kapak resmi
Embedded Systems Design for High-Speed Data Acquisition and Control
Embedded Systems Design for High-Speed Data Acquisition and Control
Yazar 
Di Paolo Emilio, Maurizio. author.
http://dx.doi.org/10.1007/978-3-319-06865-7
Format: 
Electronic Resources
Alıntı: 
Embedded Systems Design for High-Speed Data Acquisition and Control Di Paolo Emilio, Maurizio
15. 
Recent Trends in Control and Sensor Systems in Emergency Management için kapak resmi
Recent Trends in Control and Sensor Systems in Emergency Management
Recent Trends in Control and Sensor Systems in Emergency Management
Yazar 
Szewczyk, Roman. editor.
https://doi.org/10.1007/978-3-319-70452-4
Format: 
Electronic Resources
Alıntı: 
Control and Systems Theory. http://scigraph.springernature.com/things/product-market-codes/T19010
16. 
Hands-on Experience with Altera FPGA Development Boards için kapak resmi
Hands-on Experience with Altera FPGA Development Boards
Hands-on Experience with Altera FPGA Development Boards
Yazar 
Parab, Jivan S. author.
https://doi.org/10.1007/978-81-322-3769-3
Format: 
Electronic Resources
Alıntı: 
Control Structures and Microprogramming. http://scigraph.springernature.com/things/product-market
17. 
CMOS Test and Evaluation A Physical Perspective için kapak resmi
CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Yazar 
Bhushan, Manjul. author.
http://dx.doi.org/10.1007/978-1-4939-1349-7
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
18. 
Reliable Design of Electronic Equipment An Engineering Guide için kapak resmi
Reliable Design of Electronic Equipment An Engineering Guide
Reliable Design of Electronic Equipment An Engineering Guide
Yazar 
Natarajan, Dhanasekharan. author.
http://dx.doi.org/10.1007/978-3-319-09111-2
Format: 
Electronic Resources
Alıntı: 
Reliable Design of Electronic Equipment An Engineering Guide / Natarajan, Dhanasekharan. author.
19. 
Dependable Multicore Architectures at Nanoscale için kapak resmi
Dependable Multicore Architectures at Nanoscale
Dependable Multicore Architectures at Nanoscale
Yazar 
Ottavi, Marco. editor.
https://doi.org/10.1007/978-3-319-54422-9
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk. http://scigraph.springernature.com/things/product
20. 
Spectrum Sharing in Cognitive Radio Networks Medium Access Control Protocol Based Approach için kapak resmi
Spectrum Sharing in Cognitive Radio Networks Medium Access Control Protocol Based Approach
Spectrum Sharing in Cognitive Radio Networks Medium Access Control Protocol Based Approach
Yazar 
Pandit, Shweta. author.
https://doi.org/10.1007/978-3-319-53147-2
Format: 
Electronic Resources
Alıntı: 
Spectrum Sharing in Cognitive Radio Networks Medium Access Control Protocol Based Approach / Pandit
21. 
Flight Systems and Control A Practical Approach için kapak resmi
Flight Systems and Control A Practical Approach
Flight Systems and Control A Practical Approach
Yazar 
Ng, Tian Seng. author.
https://doi.org/10.1007/978-981-10-8721-9
Format: 
Electronic Resources
Alıntı: 
Control and Systems Theory. http://scigraph.springernature.com/things/product-market-codes/T19010
22. 
Occupational Injuries From Electrical Shock and Arc Flash Events için kapak resmi
Occupational Injuries From Electrical Shock and Arc Flash Events
Occupational Injuries From Electrical Shock and Arc Flash Events
Yazar 
Campbell, Richard B. author.
http://dx.doi.org/10.1007/978-1-4939-6508-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
23. 
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes için kapak resmi
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Yazar 
Balasinski, Artur. author.
http://dx.doi.org/10.1007/978-1-4614-1761-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
24. 
Computational Problems in Science and Engineering için kapak resmi
Computational Problems in Science and Engineering
Computational Problems in Science and Engineering
Yazar 
Mastorakis, Nikos. editor.
http://dx.doi.org/10.1007/978-3-319-15765-8
Format: 
Electronic Resources
Alıntı: 
Computational Problems in Science and Engineering Mastorakis, Nikos. editor.
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38 sonuç bulundu Arama sonuçlarına abone ol
Arama Sonuçlarını Sınırlandır
Yazar
SpringerLink (Online service)
(38)
Birolini, Alessandro. author.
(2)
Wang, Jinsong. editor.
(2)
Alippi, Cesare. author.
(1)
Ao, Sio-Iong. editor.
(1)
Format
Dil
Basım Yılı
Konu
Electronics and Microelectronics, Instrumentation.
(38)
Engineering.
(26)
Microelectronics.
(21)
Circuits and Systems.
(16)
Quality Control, Reliability, Safety and Risk.
(9)
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