Search Results for Reliability.

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Power GaN Devices Materials, Applications and Reliability

Yazar

Meneghini, Matteo. editor.

https://doi.org/10.1007/978-3-319-43199-4

Format:

Electronic Resources

Alıntı:

Power GaN Devices Materials, Applications and Reliability / Meneghini, Matteo. editor.

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization

Yazar

Richter, Detlev. author.

http://dx.doi.org/10.1007/978-94-007-6082-0

Format:

Electronic Resources

Alıntı:

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization / Richter

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Yazar

Franco, Jacopo. author.

http://dx.doi.org/10.1007/978-94-007-7663-0

Format:

Electronic Resources

Alıntı:

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Franco, Jacopo

Bias Temperature Instability for Devices and Circuits

Yazar

Grasser, Tibor. editor.

http://dx.doi.org/10.1007/978-1-4614-7909-3

Format:

Electronic Resources

Alıntı:

Quality Control, Reliability, Safety and Risk.

CMOS Test and Evaluation A Physical Perspective

Yazar

Bhushan, Manjul. author.

http://dx.doi.org/10.1007/978-1-4939-1349-7

Format:

Electronic Resources

Alıntı:

Quality Control, Reliability, Safety and Risk.

Nano-CMOS and Post-CMOS Electronics Devices and Modelling

Yazar

Mohanty, Saraju P., ed.

http://dx.doi.org/10.1049/PBCS029E

Format:

Electronic Resources

Alıntı:

Integrated circuits -- Reliability.

Exploring Memory Hierarchy Design with Emerging Memory Technologies

Yazar

Sun, Guangyu. author.

http://dx.doi.org/10.1007/978-3-319-00681-9

Format:

Electronic Resources

Alıntı:

high reliability memory hierarchy in computer systems based on emerging memory technologies, such as

Energy-Efficient Fault-Tolerant Systems

Yazar

Mathew, Jimson. editor.

http://dx.doi.org/10.1007/978-1-4614-4193-9

Format:

Electronic Resources

Alıntı:

conflicting problems of energy efficiency and fault-tolerance for reliability; · Covers the entire

Semiconductor material and device characterization

Yazar

Schroder, Dieter K., author.

Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928

Format:

Electronic Resources

Alıntı:

spreading resistance, and ballistic electron emission microscopy.. Reliability and Failure Analysis examines

10.

Nano-Scaled Semiconductor Devices Physics, Modelling, Characterisation, and Societal Impact

Yazar

Gutierrez-D, Edmundo A., ed.

http://dx.doi.org/10.1049/PBCS027E

Format:

Electronic Resources

Alıntı:

comes with second-order effects that degrade device performance, impact its longterm reliability

11.

Fundamentals of silicon carbide technology : growth, characterization, devices and applications

Yazar

Kimoto, Tsunenobu, 1963-

Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6928768

Format:

Electronic Resources

Alıntı:

8.2.10 Inversion Layer Electron Mobility 329 -- 8.2.11 Oxide Reliability 339 -- 8.2.12 MOSFET

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