Yazar
Meneghini, Matteo. editor.
Format:
Electronic Resources
Alıntı:
Power GaN Devices Materials, Applications and Reliability / Meneghini, Matteo. editor.
Yazar
Richter, Detlev. author.
Format:
Electronic Resources
Alıntı:
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization / Richter
View Other Search Results
Yazar
Franco, Jacopo. author.
Format:
Electronic Resources
Alıntı:
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Franco, Jacopo
Yazar
Grasser, Tibor. editor.
Format:
Electronic Resources
Alıntı:
Quality Control, Reliability, Safety and Risk.
Yazar
Bhushan, Manjul. author.
Format:
Electronic Resources
Alıntı:
Quality Control, Reliability, Safety and Risk.
Yazar
Mohanty, Saraju P., ed.
Format:
Electronic Resources
Alıntı:
Integrated circuits -- Reliability.
Yazar
Mathew, Jimson. editor.
Format:
Electronic Resources
Alıntı:
conflicting problems of energy efficiency and fault-tolerance for reliability; · Covers the entire
Yazar
Sun, Guangyu. author.
Format:
Electronic Resources
Alıntı:
high reliability memory hierarchy in computer systems based on emerging memory technologies, such as
Yazar
Schroder, Dieter K., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928
Format:
Electronic Resources
Alıntı:
spreading resistance, and ballistic electron emission microscopy.. Reliability and Failure Analysis examines
Yazar
Gutierrez-D, Edmundo A., ed.
Format:
Electronic Resources
Alıntı:
comes with second-order effects that degrade device performance, impact its longterm reliability
Yazar
Kimoto, Tsunenobu, 1963-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6928768
Format:
Electronic Resources
Alıntı:
8.2.10 Inversion Layer Electron Mobility 329 -- 8.2.11 Oxide Reliability 339 -- 8.2.12 MOSFET
Arama Sonuçlarını Sınırlandır
Daraltılmış: