VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Başlık:
VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Yazar:
Kaushik, Brajesh Kumar. editor.
ISBN:
9789811074707
Edisyon:
1st ed. 2017.
Fiziksel Niteleme:
XXI, 815 p. 486 illus. online resource.
Seri:
Communications in Computer and Information Science, 711
İçindekiler:
Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification.
Özet:
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Konu Başlığı:
Ek Kurum Yazar:
Elektronik Erişim:
https://doi.org/10.1007/978-981-10-7470-7