VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Başlık:
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Yazar:
Sengupta, Anirban. editor.
ISBN:
9789813297678
Edisyon:
1st ed. 2019.
Fiziksel Niteleme:
XVI, 775 p. 545 illus., 336 illus. in color. online resource.
Seri:
Communications in Computer and Information Science, 1066
İçindekiler:
Analog and Mixed Signal Design -- Computing Architecture and Security -- Hardware Design and Optimization -- Low Power VLSI and Memory Design. -Device Modelling -- Hardware Implementation.
Özet:
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Konu Başlığı:
Ek Kurum Yazar:
Elektronik Erişim:
https://doi.org/10.1007/978-981-32-9767-8