Circuit Design for Reliability

CMOS RF Circuit Design for Reliability and Variability

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization

Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability

Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthday

VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes

Bias Temperature Instability for Devices and Circuits

CMOS Test and Evaluation A Physical Perspective

Software Design for Resilient Computer Systems