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Yuan, Jiann-Shiun. author.
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Electronic Resources
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CMOS RF Circuit Design for Reliability and Variability Yuan, Jiann-Shiun. author.
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Fischer-Hirchert, Ulrich H. P. author.
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Electronic Resources
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techniques such as FEM, BPM and ray tracing are explained in depth. Finally, all recent reliability test
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Mathew, Jimson. editor.
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Electronic Resources
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conflicting problems of energy efficiency and fault-tolerance for reliability; · Covers the entire
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