27 sonuç bulundu Arama sonuçlarına abone ol
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Yazar 
Yuan, Jiann-Shiun. author.
Format: 
Electronic Resources
Alıntı: 
CMOS RF Circuit Design for Reliability and Variability Yuan, Jiann-Shiun. author.
Yazar 
Richter, Detlev. author.
Format: 
Electronic Resources
Alıntı: 
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization / Richter
Yazar 
El-Kareh, Badih. author.
Format: 
Electronic Resources
Alıntı: 
Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability /
Yazar 
Franco, Jacopo. author.
Format: 
Electronic Resources
Alıntı: 
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Franco, Jacopo
Yazar 
Wang, Zheng. author.
Format: 
Electronic Resources
Alıntı: 
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip Wang, Zheng
Yazar 
Hu, Jie. author.
Format: 
Electronic Resources
Alıntı: 
Performance and Reliability. http://scigraph.springernature.com/things/product-market-codes/I12077
Yazar 
Sayil, Selahattin. author.
Format: 
Electronic Resources
Alıntı: 
includes the reliability of low power energy-efficient designs and the impact of leakage power consumption
Yazar 
Zhao, Weisheng. editor.
Format: 
Electronic Resources
Alıntı: 
junctions -- Spin transfer torque magnetic memory design and simulation -- Reliability design of hybrid
Yazar 
Freeman, Yuri. author.
Format: 
Electronic Resources
Alıntı: 
reliability of the capacitors are demonstrated.  The theoretical models discussed include the thermodynamics
Yazar 
J.M. Veendrick, Harry. author.
Format: 
Electronic Resources
Alıntı: 
Nanometer CMOS Designs: Signal Integrity, Variability and Reliability -- Testing, Yield, Packaging, Debug
Yazar 
Li, Ting. editor.
Format: 
Electronic Resources
Alıntı: 
reliability of FinFET devices -- Performance, optimization, and challenges of emerging nanowire field-effect
Yazar 
LARI, VAHID. author.
Format: 
Electronic Resources
Alıntı: 
guarantees of non-functional execution qualities such as performance, power consumption, and reliability. For
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