Search Results for Machine learning.

4 sonuç bulundu

Arama sonuçlarına abone ol

Tümünü Seç

1

Liste görünümüne geç

Küçük resim görünümüne geç

0000DEFAULTTR

Yazdır

1.

Interactive Theorem Proving 6th International Conference, ITP 2015, Nanjing, China, August 24-27, 2015, Proceedings için kapak resmi

Interactive Theorem Proving 6th International Conference, ITP 2015, Nanjing, China, August 24-27, 2015, Proceedings

Interactive Theorem Proving 6th International Conference, ITP 2015, Nanjing, China, August 24-27, 2015, Proceedings

Yazar

Urban, Christian. editor.

http://dx.doi.org/10.1007/978-3-319-22102-1

Format:

Electronic Resources

Alıntı:

Machine-Code Decompilation in HOL4 -- A Formalized Hierarchy of Probabilistic System Types -- Learning To Parse

2.

Innovative Security Solutions for Information Technology and Communications 8th International Conference, SECITC 2015, Bucharest, Romania, June 11-12, 2015. Revised Selected Papers için kapak resmi

Innovative Security Solutions for Information Technology and Communications 8th International Conference, SECITC 2015, Bucharest, Romania, June 11-12, 2015. Revised Selected Papers

Innovative Security Solutions for Information Technology and Communications 8th International Conference, SECITC 2015, Bucharest, Romania, June 11-12, 2015. Revised Selected Papers

Yazar

Bica, Ion. editor.

http://dx.doi.org/10.1007/978-3-319-27179-8

Format:

Electronic Resources

Alıntı:

Mitigation Approach for MANETs -- Up-high to Down-low: Applying Machine Learning to an Exploit Database

3.

Constructive Side-Channel Analysis and Secure Design 6th International Workshop, COSADE 2015, Berlin, Germany, April 13-14, 2015. Revised Selected Papers için kapak resmi

Constructive Side-Channel Analysis and Secure Design 6th International Workshop, COSADE 2015, Berlin, Germany, April 13-14, 2015. Revised Selected Papers

Constructive Side-Channel Analysis and Secure Design 6th International Workshop, COSADE 2015, Berlin, Germany, April 13-14, 2015. Revised Selected Papers

Yazar

Mangard, Stefan. editor.

http://dx.doi.org/10.1007/978-3-319-21476-4

Format:

Electronic Resources

Alıntı:

Learning Revisited (and the Curse of Dimensionality in Side-Channel Analysis) -- Efficient Selection of

4.

Encyclopedia of Biometrics için kapak resmi

Encyclopedia of Biometrics

Encyclopedia of Biometrics

Yazar

Li, Stan Z. editor.

http://dx.doi.org/10.1007/978-1-4899-7488-4

Format:

Electronic Resources

Alıntı:

, Standardization of -- Supervised Learning -- Support Vector Machine -- Surveillance -- Tamper-Proof Operating

Tümünü Seç

1

4 sonuç bulundu

Arama sonuçlarına abone ol

Arama Sonuçlarını Sınırlandır

TED Üniversitesi

Ziya Gökalp Caddesi No.48 06420, Kolej Çankaya Ankara Tel: +90 312 585 0083

Powered by Informascope

Copyright 2023 Sirsi Corporation - Enterprise Version 5.2.1.2