Yazar
DeVor, Richard E.
Format:
Kitap
Alıntı:
Statistical quality design and control : contemporary concepts and methods/ DeVor, Richard E.
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Yazar
May, Gary S., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952
Format:
Electronic Resources
Alıntı:
Fundamentals of semiconductor manufacturing and process control / May, Gary S., author.
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