14 sonuç bulundu Arama sonuçlarına abone ol
Tümünü Seç
Liste görünümüne geç
Küçük resim görünümüne geç
000000000000DEFAULTTR
Yazdır
2. 
Trace-Based Post-Silicon Validation for VLSI Circuits için kapak resmi
Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Yazar 
Liu, Xiao. author.
http://dx.doi.org/10.1007/978-3-319-00533-1
Format: 
Electronic Resources
Alıntı: 
Lecture Notes in Electrical Engineering,
3. 
Semiconductor Technologies in the Era of Electronics için kapak resmi
Semiconductor Technologies in the Era of Electronics
Semiconductor Technologies in the Era of Electronics
Yazar 
Kang, Yong Hoon. author.
http://dx.doi.org/10.1007/978-94-017-8768-0
Format: 
Electronic Resources
Alıntı: 
Lecture Notes in Electrical Engineering,
4. 
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch için kapak resmi
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
Yazar 
Srivastava, Viranjay M. author.
http://dx.doi.org/10.1007/978-3-319-01165-3
Format: 
Electronic Resources
Alıntı: 
Communications Engineering, Networks.
5. 
Energy-Efficient Fault-Tolerant Systems için kapak resmi
Energy-Efficient Fault-Tolerant Systems
Energy-Efficient Fault-Tolerant Systems
Yazar 
Mathew, Jimson. editor.
http://dx.doi.org/10.1007/978-1-4614-4193-9
Format: 
Electronic Resources
Alıntı: 
Microwaves, RF and Optical Engineering.
6. 
Physics of Semiconductor Devices için kapak resmi
Physics of Semiconductor Devices
Physics of Semiconductor Devices
Yazar 
Rudan, Massimo. author.
http://dx.doi.org/10.1007/978-1-4939-1151-6
Format: 
Electronic Resources
Alıntı: 
Engineering.
7. 
The Boundary-Scan Handbook için kapak resmi
The Boundary-Scan Handbook
The Boundary-Scan Handbook
Yazar 
Parker, Kenneth P. author.
http://dx.doi.org/10.1007/978-3-319-01174-5
Format: 
Electronic Resources
Alıntı: 
Engineering.
8. 
Dry Etching Technology for Semiconductors için kapak resmi
Dry Etching Technology for Semiconductors
Dry Etching Technology for Semiconductors
Yazar 
Nojiri, Kazuo. author.
http://dx.doi.org/10.1007/978-3-319-10295-5
Format: 
Electronic Resources
Alıntı: 
Engineering.
11. 
CMOS Test and Evaluation A Physical Perspective için kapak resmi
CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Yazar 
Bhushan, Manjul. author.
http://dx.doi.org/10.1007/978-1-4939-1349-7
Format: 
Electronic Resources
Alıntı: 
Engineering.
Tümünü Seç
14 sonuç bulundu Arama sonuçlarına abone ol
Arama Sonuçlarını Sınırlandır
Yazar
Format
Dil
Basım Yılı
Konu
Materyal Türü
Kütüphane

TED Üniversitesi

Ziya Gökalp Caddesi No.48 06420, Kolej Çankaya Ankara Tel: +90 312 585 0083

Powered by Informascope