Electrical Impedance Spectroscopy for Structural Health Monitoring -- In situ observation of NiTi Transformation Behaviour: A Micro-macro Approach -- Bio-inspired Design of a Multi-scale Pass Band Frequency Sensor Using Local Resonance Phenomena -- Dynamic Equations for an Isotropic Spherical Shell Using Power Series Method and Surface Differential Operators -- Hydrogen Embrittlement and “Cold Fusion” Effects in Palladium During Electrolysis Experiments -- Torque Arm Actuated Bi-Stable Buckled Energy Harvester Characterization -- Validating FSI Simulations in LS-DYNA 980 -- Fundamental Frequencies of Slender Beams Subject to Imposed Axial End Displacements -- Characterization of a Heating and Quenching Apparatus for Microgravity Testing -- Phase Unwrapping Work Done via Graphic Processing Unit -- Classification of Low Velocity Impact Using Spiral Sensing Technique -- Residual Stress Measurements in  Finite-Thickness Materials by Hole-Drilling -- Residual Stress Response to Peening in Metallic Glass -- Residual Stress Modeling and Measurement in An Aluminum Wrought Alloy -- Notch Fatigue Behaviour of Shot Peened High-strength Aluminium Alloys: Role of the Residual Stress Field Ahead of the Notch Root -- Residual Stress of Individual Aluminum Grains from Three Dimensional X-Ray Diffraction -- Incremental Ring Core by Optical Methods. Preliminary Results -- Uncertainty Quantification in VFM Identification -- Modal Identification of Over-damped Structural Systems Using Extended Ibrahim Time-Domain Method -- Structural Health Monitoring by Laser Shearography: Experimental and Numerical Investigations -- On Improving Thermoelastic Stress Analysis Data Near Edges of Discontinuities -- Measurement of Stress Network in Granular Materials from Infrared Measurement -- Influence of Relative Humidity Upon the Thermomechanical Behavior Of PA6.6 -- Temperature Field in FSW Process: Experimental Measurement and Numerical Simulation -- Dynamics of Strain Localization Associated With Luders Deformation - An Insight -- Raman Spectroscopy-enhanced IIT: In situ Analysis of Mechanically Stressed Polycrystalline Si Fhin Films.