Characterization of Wide Bandgap Power Semiconductor Devices için kapak resmi
Characterization of Wide Bandgap Power Semiconductor Devices
Başlık:
Characterization of Wide Bandgap Power Semiconductor Devices
Yazar:
Wang, Fei (Fred)
ISBN:
9781785614927
Yayın Bilgisi:
Stevenage : IET, 2018.
Fiziksel Niteleme:
1 online resource (376 p.)
Seri:
Energy Engineering

Energy Engineering.
Özet:
The book has 11 chapters and covers the following topics: Pulsed static characterization; Junction capacitance characterization; Fundamentals of dynamic characterization; Gate drive for dynamic characterization; Layout design and parasitic management; Protection design for double pulse test; Measurement and data processing for dynamic characterization; Cross-talk consideration; Impact of three-phase system; Topology consideration; and Appendices on Recommended equipment and components list for DPT setup; and Data processing code for dynamic characterization are given.
Yazar Ek Girişi: