Yazar
Burbank, Jack, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6078483
Format:
Electronic Resources
Alıntı:
M&S. Physical layer M&S. Medium access control M&S. Higher layer M&SAfter discussing each of these
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Yazar
Schneidewind, Norman, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884
Format:
Electronic Resources
Alıntı:
availability. Statistical process and product control. Fault tree analysis and risk management. Effective
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