Search Results for Reliability.

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization

Yazar

Richter, Detlev. author.

http://dx.doi.org/10.1007/978-94-007-6082-0

Format:

Electronic Resources

Alıntı:

Flash Memories Economic Principles of Performance, Cost and Reliability Optimization / Richter

Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems

Yazar

Kadry, Seifedine. editor.

http://dx.doi.org/10.1007/978-3-319-07167-1

Format:

Electronic Resources

Alıntı:

Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems / Kadry

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Yazar

Franco, Jacopo. author.

http://dx.doi.org/10.1007/978-94-007-7663-0

Format:

Electronic Resources

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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications Franco, Jacopo

Energy-Efficient Fault-Tolerant Systems

Yazar

Mathew, Jimson. editor.

http://dx.doi.org/10.1007/978-1-4614-4193-9

Format:

Electronic Resources

Alıntı:

conflicting problems of energy efficiency and fault-tolerance for reliability; · Covers the entire

Insulation Measurement and Supervision in Live AC and DC Unearthed Systems

Yazar

Olszowiec, Piotr. author.

http://dx.doi.org/10.1007/978-3-319-07010-0

Format:

Electronic Resources

Alıntı:

reliability and numerous advantages offered by isolating them against ground. Insulation level is a decisive

Poly-SiGe for MEMS-above-CMOS Sensors

Yazar

Gonzalez Ruiz, Pilar. author.

http://dx.doi.org/10.1007/978-94-007-6799-7

Format:

Electronic Resources

Alıntı:

and improved reliability. Poly-SiGe for MEMS-above-CMOS sensors demonstrates the compatibility of

Machine Learning in Complex Networks

Yazar

Christiano Silva, Thiago. author.

http://dx.doi.org/10.1007/978-3-319-17290-3

Format:

Electronic Resources

Alıntı:

behavior of the proposed technique. In addition, we deal with data reliability issues or imperfect data in

Computational Methods for Solids and Fluids Multiscale Analysis, Probability Aspects and Model Reduction

Yazar

Ibrahimbegovic, Adnan. editor.

http://dx.doi.org/10.1007/978-3-319-27996-1

Format:

Electronic Resources

Alıntı:

Nikolic et al. -- Reliability calculus on crack propagation problem with a Markov renewal process, by

Direct and Large-Eddy Simulation IX

Yazar

Fröhlich, Jochen. editor.

http://dx.doi.org/10.1007/978-3-319-14448-1

Format:

Electronic Resources

Alıntı:

curvature-induced grid motion for r-adaptation, by C. Hertel, M. Joppa, B. Krull, and J. Fröhlich -- Reliability of

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