5 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Dependable Multicore Architectures at Nanoscale için kapak resmi
Dependable Multicore Architectures at Nanoscale
Dependable Multicore Architectures at Nanoscale
Yazar 
Ottavi, Marco. editor.
https://doi.org/10.1007/978-3-319-54422-9
Format: 
Electronic Resources
Alıntı: 
System safety.
2. 
Bias Temperature Instability for Devices and Circuits için kapak resmi
Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Yazar 
Grasser, Tibor. editor.
http://dx.doi.org/10.1007/978-1-4614-7909-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
3. 
CMOS Test and Evaluation A Physical Perspective için kapak resmi
CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Yazar 
Bhushan, Manjul. author.
http://dx.doi.org/10.1007/978-1-4939-1349-7
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
4. 
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes için kapak resmi
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Yazar 
Balasinski, Artur. author.
http://dx.doi.org/10.1007/978-1-4614-1761-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
5. 
The Art of Software Thermal Management for Embedded Systems için kapak resmi
The Art of Software Thermal Management for Embedded Systems
The Art of Software Thermal Management for Embedded Systems
Yazar 
Benson, Mark. author.
http://dx.doi.org/10.1007/978-1-4939-0298-9
Format: 
Electronic Resources
Alıntı: 
The Art of Software Thermal Management for Embedded Systems Benson, Mark. author.
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5 sonuç bulundu Arama sonuçlarına abone ol

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