14 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Power-system reliability calculations için kapak resmi
Power-system reliability calculations
Power-system reliability calculations
Yazar 
Billinton, Roy, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874
Format: 
Electronic Resources
Alıntı: 
Power-system reliability calculations / Billinton, Roy, author.
2. 
Semiconductor memories : technology, testing, and reliability için kapak resmi
Semiconductor memories : technology, testing, and reliability
Semiconductor memories : technology, testing, and reliability
Yazar 
Sharma, Ashok K., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
Format: 
Electronic Resources
Alıntı: 
Semiconductor memories : technology, testing, and reliability / Sharma, Ashok K., author.
3. 
Fault detectability in DWDM : toward higher signal quality & system reliability için kapak resmi
Fault detectability in DWDM : toward higher signal quality & system reliability
Fault detectability in DWDM : toward higher signal quality & system reliability
Yazar 
Kartalopoulos, Stamatios V., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624
Format: 
Electronic Resources
Alıntı: 
Fault detectability in DWDM : toward higher signal quality & system reliability / Kartalopoulos
4. 
Accelerated stress testing handbook : guide for achieving quality products için kapak resmi
Accelerated stress testing handbook : guide for achieving quality products
Accelerated stress testing handbook : guide for achieving quality products
Yazar 
Chan, H. Anthony, 1952-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476
Format: 
Electronic Resources
Alıntı: 
Electronic apparatus and appliances -- Reliability.
5. 
Design and analysis of magnetoresistive recording heads için kapak resmi
Design and analysis of magnetoresistive recording heads
Design and analysis of magnetoresistive recording heads
Yazar 
Williams, Edgar M., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5271295
Format: 
Electronic Resources
Alıntı: 
Analysis. Microtrack Profiles. Characterization of MR Device Function and Reliability. Subject Index.
6. 
Understanding electric power systems : an overview of the technology and the marketpalce için kapak resmi
Understanding electric power systems : an overview of the technology and the marketpalce
Understanding electric power systems : an overview of the technology and the marketpalce
Yazar 
Casazza, John, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201826
Format: 
Electronic Resources
Alıntı: 
utility operation, electric system control, power system reliability, government regulation, utility rate
7. 
Understanding power quality problems : voltage sags and interruptions için kapak resmi
Understanding power quality problems : voltage sags and interruptions
Understanding power quality problems : voltage sags and interruptions
Yazar 
Bollen, Math H. J., 1960-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270869
Format: 
Electronic Resources
Alıntı: 
reliability evaluation. Origins of voltage sags and interruptions. Essential analysis of voltage sags for
8. 
Advanced semiconductor memories : architectures, designs, and applications için kapak resmi
Advanced semiconductor memories : architectures, designs, and applications
Advanced semiconductor memories : architectures, designs, and applications
Yazar 
Sharma, Ashok K., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562
Format: 
Electronic Resources
Alıntı: 
Semiconductor Memories: Technology, Testing, and Reliability, the author's earlier work, Advanced Semiconductor
9. 
The LOCUS distributed system architecture için kapak resmi
The LOCUS distributed system architecture
The LOCUS distributed system architecture
Yazar 
Popek, Gerald.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267466
Format: 
Electronic Resources
Alıntı: 
transparent, distributed operation, LOCUS features also include high performance and reliability; full Unix
10. 
Probablistic risk assessment and management for engineers and scientists için kapak resmi
Probablistic risk assessment and management for engineers and scientists
Probablistic risk assessment and management for engineers and scientists
Yazar 
Kumamoto, Hiromitsu, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264399
Format: 
Electronic Resources
Alıntı: 
. Human Reliability. Uncertainty Quantification. Legal and Regulatory Risks. Index.
11. 
Design of high-performance microprocessor circuits için kapak resmi
Design of high-performance microprocessor circuits
Design of high-performance microprocessor circuits
Yazar 
Chandrakasan, Anantha P.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266000
Format: 
Electronic Resources
Alıntı: 
(Stefanos Sidropoulos, Chih-Kong Ken Yang, and Mark Horowitz). RELIABILITY. Electromigration Reliability (J
12. 
Power system economics : designing markets for electricity için kapak resmi
Power system economics : designing markets for electricity
Power system economics : designing markets for electricity
Yazar 
Stoft, Steven, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264048
Format: 
Electronic Resources
Alıntı: 
: Reliability, Price Spikes and Investment. -- Reliability and Investment Policy. -- Price Spikes Recover Fixed
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