Yazar
Fakhfakh, Mourad. editor.
Format:
Electronic Resources
Alıntı:
Sensitive Inputs on the Reliability of Nanoscale Circuits -- Pin Count and Wire Length Optimization for
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2.
Yazar
Fakhfakh, Mourad. editor.
Format:
Electronic Resources
Alıntı:
System-Level Design for Reliability: RF Front-End Application -- The Backtracking Search for the Optimal Design
View Other Search Results
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