IP Cores Design from Specifications to Production Modeling, Verification, Optimization, and Protection
Başlık:
IP Cores Design from Specifications to Production Modeling, Verification, Optimization, and Protection
Yazar:
Mohamed, Khaled Salah. author.
ISBN:
9783319220352
Fiziksel Niteleme:
IX, 154 p. 153 illus., 115 illus. in color. online resource.
Seri:
Analog Circuits and Signal Processing,
İçindekiler:
1. Introduction -- 2. IP Cores Design from Specifications to Production: Modeling, Verification, Optimization, and Protection -- 3. Analyzing the Trade-off between Different Memory Cores and Controllers -- 4. SOC BUSES AND PERIPHERALS: FEATURES AND ARCHITECTURES -- 5. Verilog for Implementation and Verification -- 6. New Trends in SoC Verification: UVM, Bug Localization, Scan-Chain-Based Methodology, GA-Based Test Generation -- 7. Conclusions.
Özet:
This book describes the life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection. Various trade-offs in the design process are discussed, including those associated with many of the most common memory cores, controller IPs and system-on-chip (SoC) buses. Readers will also benefit from the author’s practical coverage of new verification methodologies. such as bug localization, UVM, and scan-chain. A SoC case study is presented to compare traditional verification with the new verification methodologies. · Discusses the entire life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection; · Introduce a deep introduction for Verilog for both implementation and verification point of view. · Demonstrates how to use IP in applications such as memory controllers and SoC buses. · Describes a new verification methodology called bug localization; · Presents a novel scan-chain methodology for RTL debugging; · Enables readers to employ UVM methodology in straightforward, practical terms.
Ek Kurum Yazar:
Elektronik Erişim:
http://dx.doi.org/10.1007/978-3-319-22035-2