Yazar
Brewer, Joe (Joe E.)
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201541
Format:
Electronic Resources
Alıntı:
) Kuo-Min Chang -- Tunnel dielectrics for scaled flash memory cells / T. P. Ma -- Flash memory reliability
Yazar
Brown, William D., 1943-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263046
Format:
Electronic Resources
Alıntı:
(H. Naseem). Materials and Processing Considerations (S. Ang & W. Brown). Reliability Considerations
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Yazar
Jarry, Pierre, 1946- author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236479
Format:
Electronic Resources
Alıntı:
demand for accuracy, reliability, and shorter development times. Beginning with a brief review of
Yazar
Bradley, Edwin.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201530
Format:
Electronic Resources
Alıntı:
Reliability: iNEMI Evaluation and Results (Elizabeth Benedetto and John Sohn) -- 6.1. Reliability Team Goals
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