Yazar
Brewer, Joe (Joe E.)
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122
Format:
Electronic Resources
Alıntı:
/ M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation
Yazar
Brown, William D., 1943-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263046
Format:
Electronic Resources
Alıntı:
(H. Naseem). Materials and Processing Considerations (S. Ang & W. Brown). Reliability Considerations
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Yazar
Ulrich, Richard Kevin, 1955-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769522
Format:
Electronic Resources
Alıntı:
: Packaging of MEMS and MOEMS: challenges and a case study. -- Chapter 16: Reliability considerations
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