9 sonuç bulundu Arama sonuçlarına abone ol
Tümünü Seç
Liste görünümüne geç
Küçük resim görünümüne geç
000000000DEFAULTTR
Yazdır
1. 
Reliability Engineering Theory and Practice için kapak resmi
Reliability Engineering Theory and Practice
Reliability Engineering Theory and Practice
Yazar 
Birolini, Alessandro. author.
https://doi.org/10.1007/978-3-662-54209-5
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk. http://scigraph.springernature.com/things/product
2. 
Reliability Engineering Theory and Practice için kapak resmi
Reliability Engineering Theory and Practice
Reliability Engineering Theory and Practice
Yazar 
Birolini, Alessandro. author.
http://dx.doi.org/10.1007/978-3-642-39535-2
Format: 
Electronic Resources
Alıntı: 
Reliability Engineering Theory and Practice / Birolini, Alessandro. author.
3. 
Bias Temperature Instability for Devices and Circuits için kapak resmi
Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Yazar 
Grasser, Tibor. editor.
http://dx.doi.org/10.1007/978-1-4614-7909-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
4. 
CMOS Test and Evaluation A Physical Perspective için kapak resmi
CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Yazar 
Bhushan, Manjul. author.
http://dx.doi.org/10.1007/978-1-4939-1349-7
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
5. 
Reliable Design of Electronic Equipment An Engineering Guide için kapak resmi
Reliable Design of Electronic Equipment An Engineering Guide
Reliable Design of Electronic Equipment An Engineering Guide
Yazar 
Natarajan, Dhanasekharan. author.
http://dx.doi.org/10.1007/978-3-319-09111-2
Format: 
Electronic Resources
Alıntı: 
Reliable Design of Electronic Equipment An Engineering Guide / Natarajan, Dhanasekharan. author.
6. 
Dependable Multicore Architectures at Nanoscale için kapak resmi
Dependable Multicore Architectures at Nanoscale
Dependable Multicore Architectures at Nanoscale
Yazar 
Ottavi, Marco. editor.
https://doi.org/10.1007/978-3-319-54422-9
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk. http://scigraph.springernature.com/things/product
7. 
Occupational Injuries From Electrical Shock and Arc Flash Events için kapak resmi
Occupational Injuries From Electrical Shock and Arc Flash Events
Occupational Injuries From Electrical Shock and Arc Flash Events
Yazar 
Campbell, Richard B. author.
http://dx.doi.org/10.1007/978-1-4939-6508-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
8. 
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes için kapak resmi
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Yazar 
Balasinski, Artur. author.
http://dx.doi.org/10.1007/978-1-4614-1761-3
Format: 
Electronic Resources
Alıntı: 
Quality Control, Reliability, Safety and Risk.
Tümünü Seç
9 sonuç bulundu Arama sonuçlarına abone ol
Arama Sonuçlarını Sınırlandır
Yazar
Format
Dil
Basım Yılı
Konu
Materyal Türü
Lokasyon
Kütüphane

TED Üniversitesi

Ziya Gökalp Caddesi No.48 06420, Kolej Çankaya Ankara Tel: +90 312 585 0083

Powered by Informascope