Search Results for Control engineering.

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Bias Temperature Instability for Devices and Circuits

Yazar

Grasser, Tibor. editor.

http://dx.doi.org/10.1007/978-1-4614-7909-3

Format:

Electronic Resources

Alıntı:

Quality Control, Reliability, Safety and Risk.

Embedded Systems Design for High-Speed Data Acquisition and Control

Yazar

Di Paolo Emilio, Maurizio. author.

http://dx.doi.org/10.1007/978-3-319-06865-7

Format:

Electronic Resources

Alıntı:

Embedded Systems Design for High-Speed Data Acquisition and Control Di Paolo Emilio, Maurizio

CMOS Test and Evaluation A Physical Perspective

Yazar

Bhushan, Manjul. author.

http://dx.doi.org/10.1007/978-1-4939-1349-7

Format:

Electronic Resources

Alıntı:

Quality Control, Reliability, Safety and Risk.

Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes

Yazar

Balasinski, Artur. author.

http://dx.doi.org/10.1007/978-1-4614-1761-3

Format:

Electronic Resources

Alıntı:

Quality Control, Reliability, Safety and Risk.

Computational Problems in Science and Engineering

Yazar

Mastorakis, Nikos. editor.

http://dx.doi.org/10.1007/978-3-319-15765-8

Format:

Electronic Resources

Alıntı:

Computational Problems in Science and Engineering Mastorakis, Nikos. editor.

Engineering Embedded Systems Physics, Programs, Circuits

Yazar

Hintenaus, Peter. author.

http://dx.doi.org/10.1007/978-3-319-10680-9

Format:

Electronic Resources

Alıntı:

Engineering Embedded Systems Physics, Programs, Circuits / Hintenaus, Peter. author.

Computational Advancement in Communication Circuits and Systems Proceedings of ICCACCS 2014

Yazar

Maharatna, Koushik. editor.

http://dx.doi.org/10.1007/978-81-322-2274-3

Format:

Electronic Resources

Alıntı:

Lecture Notes in Electrical Engineering,

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