4 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Carrier transport in nanoscale MOS transistors için kapak resmi
Carrier transport in nanoscale MOS transistors
Carrier transport in nanoscale MOS transistors
Yazar 
Tsuchiya, Hideaki, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=7748307
Format: 
Electronic Resources
Alıntı: 
Metal oxide semiconductor field-effect transistors.
2. 
Reliability wearout mechanisms in advanced CMOS technologies için kapak resmi
Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Yazar 
Strong, Alvin Wayne, 1946-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
Format: 
Electronic Resources
Alıntı: 
Metal oxide semiconductors, Complementary -- Reliability.
3. 
Surfaces and interfaces of electronic materials için kapak resmi
Surfaces and interfaces of electronic materials
Surfaces and interfaces of electronic materials
Yazar 
Brillson, L. J., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6542360
Format: 
Electronic Resources
Alıntı: 
Electronic Structure 402 -- 20.5 Summary 439 -- 21 Metals on Semiconductors 447 -- 21.1 Overview 447 -- 21.2
4. 
Electromagnetic theory için kapak resmi
Electromagnetic theory
Electromagnetic theory
Yazar 
Stratton, Julius Adams, 1901-1994.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=7362911
Format: 
Electronic Resources
Alıntı: 
Dispersion in Dielectrics -- 5.15 Dispersion in Metals -- 5.16 Propagation in an Ionized Atmosphere
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4 sonuç bulundu Arama sonuçlarına abone ol

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