Yazar
Dolev, Shlomi. editor.
Format:
Electronic Resources
Alıntı:
Cyber Security Cryptography and Machine Learning Third International Symposium, CSCML 2019, Beer
Yazar
Dinur, Itai. editor.
Format:
Electronic Resources
Alıntı:
Cyber Security Cryptography and Machine Learning Second International Symposium, CSCML 2018, Beer
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Holzinger, Andreas. editor. (orcid)0000-0002-6786-5194
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Electronic Resources
Alıntı:
Machine Learning and Knowledge Extraction First IFIP TC 5, WG 8.4, 8.9, 12.9 International Cross
Yazar
Coppola, Massimo. editor. (orcid)0000-0002-7937-4157
Format:
Electronic Resources
Alıntı:
Machine Learning. https://scigraph.springernature.com/ontologies/product-market-codes/I21010
Yazar
Zhou, Jianying. editor. (orcid)0000-0003-0594-0432
Format:
Electronic Resources
Alıntı:
Machine Learning. https://scigraph.springernature.com/ontologies/product-market-codes/I21010
Yazar
Lin, Xiaodong. editor.
Format:
Electronic Resources
Alıntı:
105 submissions. The topics range from security and privacy in machine learning to differential
Yazar
Liu, Feng. editor.
Format:
Electronic Resources
Alıntı:
following subjects: Artificial Intelligence for Cybersecurity, Machine Learning for Cybersecurity, and
Yazar
Shi, Zhongzhi. editor.
Format:
Electronic Resources
Alıntı:
organized in topical sections on machine learning, deep learning, multi-agent systems, neural computing and
Yazar
Bailey, Michael. editor.
Format:
Electronic Resources
Alıntı:
, and users; machine learning for computer security; hardware-assisted security; software security
Yazar
Peng, Wei. editor.
Format:
Electronic Resources
Alıntı:
in artificial intelligence ranging from machine learning, optimization to big data science and their
Yazar
Lin, Zhiqiang. editor.
Format:
Electronic Resources
Alıntı:
sections named: Attacks and Cryptanalysis; Crypto I: Secure Computation and Storage; Machine Learning and
Yazar
Vento, Mario. editor. (orcid)0000-0002-2948-741X
Format:
Electronic Resources
Alıntı:
Analysis -- Machine Learning for Image and Pattern Analysis -- Data Sets and Benchmarks -- Structural and