Yazar
Fakhfakh, Mourad. editor.
Format:
Electronic Resources
Alıntı:
Sensitive Inputs on the Reliability of Nanoscale Circuits -- Pin Count and Wire Length Optimization for
2.
Yazar
Fakhfakh, Mourad. editor.
Format:
Electronic Resources
Alıntı:
System-Level Design for Reliability: RF Front-End Application -- The Backtracking Search for the Optimal Design
View Other Search Results
Yazar
Christiano Silva, Thiago. author.
Format:
Electronic Resources
Alıntı:
behavior of the proposed technique. In addition, we deal with data reliability issues or imperfect data in