Advances in Reliability and System Engineering

Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes

Bias Temperature Instability for Devices and Circuits

CMOS Test and Evaluation A Physical Perspective

Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthday

Engineering Safe and Secure Cyber-Physical Systems The Specification PEARL Approach

Circuit Design for Reliability

Dependable Multicore Architectures at Nanoscale

System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses

Software Design for Resilient Computer Systems