6 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Future trends in microelectronics : up the nano creek için kapak resmi
Future trends in microelectronics : up the nano creek
Future trends in microelectronics : up the nano creek
Yazar 
FTM-5 (2006 : Crete, Greece)
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6558560
Format: 
Electronic Resources
Alıntı: 
Future trends in microelectronics : up the nano creek / FTM-5 (2006 : Crete, Greece)
3. 
NAND flash memory technologies için kapak resmi
NAND flash memory technologies
NAND flash memory technologies
Yazar 
Aritome, Seiichi, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=7394658
Format: 
Electronic Resources
Alıntı: 
IEEE Press series on microelectronic systems.
4. 
Reliability wearout mechanisms in advanced CMOS technologies için kapak resmi
Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Yazar 
Strong, Alvin Wayne, 1946-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
Format: 
Electronic Resources
Alıntı: 
IEEE Press series on microelectronic systems ;
6. 
Enhanced phase-locked loop structures for power and energy applications için kapak resmi
Enhanced phase-locked loop structures for power and energy applications
Enhanced phase-locked loop structures for power and energy applications
Yazar 
Karimi-Ghartema, Masoud, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6798067
Format: 
Electronic Resources
Alıntı: 
IEEE Press series on microelectronic systems.
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6 sonuç bulundu Arama sonuçlarına abone ol
Git:Arama SonuçlarıSayfa BaşıArama Filtreleri

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