3 sonuç bulundu Arama sonuçlarına abone ol
Tümünü Seç
Liste görünümüne geç
Küçük resim görünümüne geç
000DEFAULTTR
Yazdır
1. 
Nonvolatile memory technologies with emphasis on Flash : a comprehensive guide to understanding and using NVM devices için kapak resmi
Nonvolatile memory technologies with emphasis on Flash : a comprehensive guide to understanding and using NVM devices
Nonvolatile memory technologies with emphasis on Flash : a comprehensive guide to understanding and using NVM devices
Yazar 
Brewer, Joe (Joe E.)
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201541
Format: 
Electronic Resources
Alıntı: 
) Kuo-Min Chang -- Tunnel dielectrics for scaled flash memory cells / T. P. Ma -- Flash memory reliability
2. 
Advanced electronic packaging. için kapak resmi
Advanced electronic packaging.
Advanced electronic packaging.
Yazar 
Brown, William D., 1943-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263046
Format: 
Electronic Resources
Alıntı: 
(H. Naseem). Materials and Processing Considerations (S. Ang & W. Brown). Reliability Considerations
3. 
Lead-free electronics : iNEMI projects lead to successful manufacturing için kapak resmi
Lead-free electronics : iNEMI projects lead to successful manufacturing
Lead-free electronics : iNEMI projects lead to successful manufacturing
Yazar 
Bradley, Edwin.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201530
Format: 
Electronic Resources
Alıntı: 
Reliability: iNEMI Evaluation and Results (Elizabeth Benedetto and John Sohn) -- 6.1. Reliability Team Goals
Tümünü Seç
3 sonuç bulundu Arama sonuçlarına abone ol
Arama Sonuçlarını Sınırlandır
Yazar
Format
Dil
Basım Yılı
Konu
Materyal Türü
Lokasyon
IEEE
(3)
Kütüphane
Git:Arama SonuçlarıSayfa BaşıArama Filtreleri

TED Üniversitesi

Ziya Gökalp Caddesi No.48 06420, Kolej Çankaya Ankara Tel: +90 312 585 0083

Powered by Informascope