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49. 
Solid State Lighting Reliability Part 2 Components to Systems için kapak resmi
Solid State Lighting Reliability Part 2 Components to Systems
Solid State Lighting Reliability Part 2 Components to Systems
Yazar 
van Driel, Willem Dirk. editor.
https://doi.org/10.1007/978-3-319-58175-0
Format: 
Electronic Resources
Alıntı: 
White-Light LEDs -- Driver Reliability: Failure Modes -- Driver Reliability: A Physics of Failure Approach for
50. 
Nano Devices and Circuit Techniques for Low-Energy Applications and Energy Harvesting için kapak resmi
Nano Devices and Circuit Techniques for Low-Energy Applications and Energy Harvesting
Nano Devices and Circuit Techniques for Low-Energy Applications and Energy Harvesting
Yazar 
Kyung, Chong-Min. editor.
http://dx.doi.org/10.1007/978-94-017-9990-4
Format: 
Electronic Resources
Alıntı: 
in a tutorial fashion from material physics, through device technology, to innovative circuit design
51. 
Advance Elements of Optoisolation Circuits Nonlinearity Applications in Engineering için kapak resmi
Advance Elements of Optoisolation Circuits Nonlinearity Applications in Engineering
Advance Elements of Optoisolation Circuits Nonlinearity Applications in Engineering
Yazar 
Aluf, Ofer. author.
https://doi.org/10.1007/978-3-319-55316-0
Format: 
Electronic Resources
Alıntı: 
engineers, students and researchers in physics who read the first book “Optoisolation Circuits Nonlinearity
52. 
Handbook of Memristor Networks için kapak resmi
Handbook of Memristor Networks
Handbook of Memristor Networks
Yazar 
Chua, Leon. editor.
https://doi.org/10.1007/978-3-319-76375-0
Format: 
Electronic Resources
Alıntı: 
learning hardware. With contributions from leaders in computer science, mathematics, electronics, physics
53. 
Hot Carrier Degradation in Semiconductor Devices için kapak resmi
Hot Carrier Degradation in Semiconductor Devices
Hot Carrier Degradation in Semiconductor Devices
Yazar 
Grasser, Tibor. editor.
http://dx.doi.org/10.1007/978-3-319-08994-2
Format: 
Electronic Resources
Alıntı: 
-- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot
54. 
Fundamentals of Electromigration-Aware Integrated Circuit Design için kapak resmi
Fundamentals of Electromigration-Aware Integrated Circuit Design
Fundamentals of Electromigration-Aware Integrated Circuit Design
Yazar 
Lienig, Jens. author.
https://doi.org/10.1007/978-3-319-73558-0
Format: 
Electronic Resources
Alıntı: 
physical design, all in-depth. Rarely, one can find a book with such scope and such practical applications
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55 sonuç bulundu Arama sonuçlarına abone ol
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SpringerLink (Online service)
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Adamatzky, Andrew. editor.
(2)
Božanić, Mladen. author.
(2)
Chua, Leon. editor.
(2)
Di Natale, Corrado. editor.
(2)
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Electronic circuits.
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Electronics and Microelectronics, Instrumentation.
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Electronics.
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Engineering.
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Electronic Circuits and Devices.
(19)
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