25.
Yazar
Sklavos, Nicolas. editor.
Format:
Electronic Resources
Alıntı:
, manufacturing, testing, reliability, validation and utilization; Describes new methods and algorithms for the
Yazar
Rahmani, Amir M. editor.
Format:
Electronic Resources
Alıntı:
aspects of dark silicon-aware architectures including design, management, reliability, and test. Readers
Yazar
Elfadel, Ibrahim (Abe) M. editor.
Format:
Electronic Resources
Alıntı:
: process, devices, and systems; •Explains the use of wireless 3D integration to improve 3D IC reliability
Yazar
Hidaka, Hideto. editor.
Format:
Electronic Resources
Alıntı:
Memory Technology, Design and Reliability -- SONOS 1Tr eFlash memory -- SONOS split-gate eFlash memory.
Yazar
Moiseev, Konstantin. author.
Format:
Electronic Resources
Alıntı:
, Intel Corporation; President, Intel Israel The speed, power, area, and reliability of high performance
Yazar
Lienig, Jens. author.
Format:
Electronic Resources
Alıntı:
technologies to reduce electromigration’s negative impact on circuit reliability. Enables readers to understand