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Yazar
Leonard, James V.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263105
Format:
Electronic Resources
Alıntı:
Object-oriented simulation : reusability, adaptability, maintainability / Leonard, James V.
Yazar
Kamm, Lawrence J., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5443939
Format:
Electronic Resources
Alıntı:
Parameter: Money. Quantity Effects on Design. Reliability and Maintenance. Models and Experiments. Improving
Yazar
Li, Wenyuan, author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732783
Format:
Electronic Resources
Alıntı:
-- Probabilistic Reliability Evaluation -- Economic Analysis Methods -- Data in Probabilistic Transmission Planning
Yazar
Robertazzi, Thomas G., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263905
Format:
Electronic Resources
Alıntı:
accessible treatment of linear programming and graph algorithms. Other featured topics cover: . Reliability
Yazar
Kamm, Lawrence J., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273061
Format:
Electronic Resources
Alıntı:
. User-Friendly Design. Accuracy, Adjustment, and Gauging. Reliability, Defects, Abuse, Failure, and Maintenance
Yazar
Brewer, Joe (Joe E.)
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122
Format:
Electronic Resources
Alıntı:
/ M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation
Yazar
Brewer, Joe (Joe E.)
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201541
Format:
Electronic Resources
Alıntı:
) Kuo-Min Chang -- Tunnel dielectrics for scaled flash memory cells / T. P. Ma -- Flash memory reliability
Yazar
Bollen, Math H. J., 1960-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270869
Format:
Electronic Resources
Alıntı:
reliability evaluation. Origins of voltage sags and interruptions. Essential analysis of voltage sags for
Yazar
El-Hawary, M. E.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266264
Format:
Electronic Resources
Alıntı:
Reliability / V. Miranda -- Ch. 10. Operation Support Expert System for Startup Schedule Optimization in
Yazar
Sharma, Ashok K., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562
Format:
Electronic Resources
Alıntı:
Semiconductor Memories: Technology, Testing, and Reliability, the author's earlier work, Advanced Semiconductor
Yazar
Brown, William D., 1943-
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263046
Format:
Electronic Resources
Alıntı:
(H. Naseem). Materials and Processing Considerations (S. Ang & W. Brown). Reliability Considerations
Yazar
Schroder, Dieter K., author.
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928
Format:
Electronic Resources
Alıntı:
spreading resistance, and ballistic electron emission microscopy.. Reliability and Failure Analysis examines
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