Search Results for Reliability.

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25.

Exploring Memory Hierarchy Design with Emerging Memory Technologies

Yazar

Sun, Guangyu. author.

http://dx.doi.org/10.1007/978-3-319-00681-9

Format:

Electronic Resources

Alıntı:

high reliability memory hierarchy in computer systems based on emerging memory technologies, such as

26.

Computing with Memory for Energy-Efficient Robust Systems

Yazar

Paul, Somnath. author.

http://dx.doi.org/10.1007/978-1-4614-7798-3

Format:

Electronic Resources

Alıntı:

memory for both data storage and computation to maximize the energy-efficiency and reliability. The

27.

Routing Algorithms in Networks-on-Chip

Yazar

Palesi, Maurizio. editor.

http://dx.doi.org/10.1007/978-1-4614-8274-1

Format:

Electronic Resources

Alıntı:

-- Path-based Multicast Routing for 2D and 3D Mesh Networks -- Part III Fault Tolerance and Reliability

28.

The Art of Software Thermal Management for Embedded Systems

Yazar

Benson, Mark. author.

http://dx.doi.org/10.1007/978-1-4939-0298-9

Format:

Electronic Resources

Alıntı:

a computing system, in order to manage heat, improve component reliability, and increase system

29.

Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications

Yazar

Qu, Shichun. author.

http://dx.doi.org/10.1007/978-1-4939-1556-9

Format:

Electronic Resources

Alıntı:

characterization, reliability, and modeling. Recent advances in analog and power electronic WLCSP packaging are

30.

3D Stacked Chips From Emerging Processes to Heterogeneous Systems

Yazar

Elfadel, Ibrahim (Abe) M. editor.

http://dx.doi.org/10.1007/978-3-319-20481-9

Format:

Electronic Resources

Alıntı:

: process, devices, and systems; •Explains the use of wireless 3D integration to improve 3D IC reliability

31.

Temperature- and Supply Voltage-Independent Time References for Wireless Sensor Networks

Yazar

De Smedt, Valentijn. author.

http://dx.doi.org/10.1007/978-3-319-09003-0

Format:

Electronic Resources

Alıntı:

design trade-offs; • to demonstrate the reliability and functionality of the developed building blocks by

32.

Thermal Management for LED Applications

Yazar

Lasance, Clemens J.M. editor.

http://dx.doi.org/10.1007/978-1-4614-5091-7

Format:

Electronic Resources

Alıntı:

characterization and testing of LEDs, and issues related to failure mechanisms and reliability and performance in

33.

Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling

Yazar

Mahapatra, Souvik. editor.

http://dx.doi.org/10.1007/978-81-322-2508-9

Format:

Electronic Resources

Alıntı:

important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology

34.

Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design

Yazar

Fakhfakh, Mourad. editor.

http://dx.doi.org/10.1007/978-3-319-19872-9

Format:

Electronic Resources

Alıntı:

System-Level Design for Reliability: RF Front-End Application -- The Backtracking Search for the Optimal Design

35.

Poly-SiGe for MEMS-above-CMOS Sensors

Yazar

Gonzalez Ruiz, Pilar. author.

http://dx.doi.org/10.1007/978-94-007-6799-7

Format:

Electronic Resources

Alıntı:

and improved reliability. Poly-SiGe for MEMS-above-CMOS sensors demonstrates the compatibility of

36.

Algorithm & SoC Design for Automotive Vision Systems For Smart Safe Driving System

Yazar

Kim, Jaeseok. editor.

http://dx.doi.org/10.1007/978-94-017-9075-8

Format:

Electronic Resources

Alıntı:

such as SoC architecture, hardware accelerator, software development environment, and reliability

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