Digital systems testing and testable design
tarafından
Abramovici, Miron, author.
Başlık
:
Digital systems testing and testable design
Yazar
:
Abramovici, Miron, author.
ISBN
:
9780470544389
Yazar
:
Abramovici, Miron, author.
Fiziksel Niteleme
:
1 PDF (xxi, 653 pages) : illustrations.
Seri
:
Electrical engineering, communications, and signal processing
İçindekiler
:
Preface. How This Book Was Written. Introduction. Modeling. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test. Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis. Index.
Özet
:
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Konu Başlığı
:
Digital integrated circuits -- Testing.
Digital integrated circuits -- Design and construction.
Tür
:
Electronic books.
Yazar Ek Girişi
:
Breuer, Melvin A.
Friedman, Arthur D.
Ek Kurum Yazar
:
John Wiley & Sons,
IEEE Xplore (Online service),
Elektronik Erişim
:
| Materyal Türü | Barkod | Yer Numarası | Durumu/İade Tarihi |
|---|
| Electronic Book | 15256-1001 | TK7874 .A23 1990 EB | IEEE |