Research on the Radiation Effects and Compact Model of SiGe HBT
tarafından
Sun, Yabin. author.
Başlık
:
Research on the Radiation Effects and Compact Model of SiGe HBT
Yazar
:
Sun, Yabin. author.
ISBN
:
9789811046124
Yazar
:
Sun, Yabin. author.
Edisyon
:
1st ed. 2018.
Fiziksel Niteleme
:
XXIV, 168 p. 171 illus. online resource.
Seri
:
Springer Theses, Recognizing Outstanding Ph.D. Research,
İçindekiler
:
Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion.
Özet
:
This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique.
Konu Başlığı
:
Electronics.
Optical materials.
Electronics and Microelectronics, Instrumentation. http://scigraph.springernature.com/things/product-market-codes/T24027
Semiconductors. http://scigraph.springernature.com/things/product-market-codes/P25150
Optical and Electronic Materials. http://scigraph.springernature.com/things/product-market-codes/Z12000
Electronic Circuits and Devices. http://scigraph.springernature.com/things/product-market-codes/P31010
Solid State Physics. http://scigraph.springernature.com/things/product-market-codes/P25013
Ek Kurum Yazar
:
SpringerLink (Online service)
Elektronik Erişim
:
Materyal Türü | Barkod | Yer Numarası | Durumu/İade Tarihi |
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Electronic Book | 225746-1001 | TK7800 -8360 | Springer E-Book Collection |