Characterization of Wide Bandgap Power Semiconductor Devices
tarafından
Wang, Fei (Fred)
Başlık
:
Characterization of Wide Bandgap Power Semiconductor Devices
Yazar
:
Wang, Fei (Fred)
ISBN
:
9781785614927
Yazar
:
Wang, Fei (Fred)
Yayın Bilgisi
:
Stevenage : IET, 2018.
Fiziksel Niteleme
:
1 online resource (376 p.)
Seri
:
Energy Engineering
Energy Engineering.
Özet
:
The book has 11 chapters and covers the following topics: Pulsed static characterization; Junction capacitance characterization; Fundamentals of dynamic characterization; Gate drive for dynamic characterization; Layout design and parasitic management; Protection design for double pulse test; Measurement and data processing for dynamic characterization; Cross-talk consideration; Impact of three-phase system; Topology consideration; and Appendices on Recommended equipment and components list for DPT setup; and Data processing code for dynamic characterization are given.
Konu Başlığı
:
Electric capacity.
Electronic apparatus and appliances.
Power semiconductors.
Semiconductors.
Wide gap semiconductors.
capacitance.
network topology.
power semiconductor devices.
semiconductor device models.
wide band gap semiconductors.
Yazar Ek Girişi
:
Zhang, Zheyu
Jones, Edward A.
Elektronik Erişim
:
Materyal Türü | Barkod | Yer Numarası | Durumu/İade Tarihi |
---|
Electronic Book | 220940-1001 | XX(220940.1) | IET E-Book Collection |