Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability
tarafından
 
El-Kareh, Badih. author.

Başlık
Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability

Yazar
El-Kareh, Badih. author.

ISBN
9781493927517

Yazar
El-Kareh, Badih. author.

Fiziksel Niteleme
XLI, 607 p. 454 illus. online resource.

İçindekiler
The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.

Özet
This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.

Konu Başlığı
Engineering.
 
Electronic circuits.
 
Optical materials.
 
Electronic materials.
 
Circuits and Systems.
 
Electronic Circuits and Devices.
 
Optical and Electronic Materials.

Yazar Ek Girişi
Hutter, Lou N.

Ek Kurum Yazar
SpringerLink (Online service)

Elektronik Erişim
http://dx.doi.org/10.1007/978-1-4939-2751-7


Materyal TürüBarkodYer NumarasıDurumu/İade Tarihi
Electronic Book19955-1001TK7888.4Springer E-Book Collection