This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems.  It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches.  Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented. ·         Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability; ·         Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches; ·         Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.