VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
tarafından
 
Shin, Youngsoo. editor.

Başlık
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Yazar
Shin, Youngsoo. editor.

ISBN
9783319460970

Fiziksel Niteleme
XIII, 223 p. 121 illus. online resource.

Seri
IFIP Advances in Information and Communication Technology, 483

Özet
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

Konu Başlığı
Computer science.
 
Computer hardware.
 
Computer organization.
 
Computer-aided engineering.
 
Electronic circuits.
 
Computer Systems Organization and Communication Networks.
 
Computer-Aided Engineering (CAD, CAE) and Design.
 
Circuits and Systems.

Yazar Ek Girişi
Shin, Youngsoo.
 
Tsui, Chi Ying.
 
Kim, Jae-Joon.
 
Choi, Kiyoung.
 
Reis, Ricardo.

Ek Kurum Yazar
SpringerLink (Online service)

Elektronik Erişim
http://dx.doi.org/10.1007/978-3-319-46097-0


Materyal TürüBarkodYer NumarasıDurumu/İade Tarihi
Electronic Book18366-1001QA76.9 .C643Springer E-Book Collection