Search Results for System safety. - Narrowed by: Electronics and Microelectronics, Instrumentation.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dSystem$002bsafety.$0026qf$003dSUBJECT$002509Konu$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2024-09-06T23:40:49ZReliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:2246992024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Birolini, Alessandro. author.<br/><a href="https://doi.org/10.1007/978-3-662-54209-5">https://doi.org/10.1007/978-3-662-54209-5</a><br/>Format: Electronic Resources<br/>Dependable Multicore Architectures at Nanoscaleent://SD_ILS/0/SD_ILS:2259892024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Ottavi, Marco. editor.<br/><a href="https://doi.org/10.1007/978-3-319-54422-9">https://doi.org/10.1007/978-3-319-54422-9</a><br/>Format: Electronic Resources<br/>Functional Safety for Road Vehicles New Challenges and Solutions for E-mobility and Automated Drivingent://SD_ILS/0/SD_ILS:178402024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Ross, Hans-Leo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-33361-8">http://dx.doi.org/10.1007/978-3-319-33361-8</a><br/>Format: Electronic Resources<br/>Bias Temperature Instability for Devices and Circuitsent://SD_ILS/0/SD_ILS:196802024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:199132024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Bhushan, Manjul. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-1349-7">http://dx.doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodesent://SD_ILS/0/SD_ILS:195932024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>Proceedings of the First Symposium on Aviation Maintenance and Management-Volume IIent://SD_ILS/0/SD_ILS:239722024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Wang, Jinsong. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-642-54233-6">http://dx.doi.org/10.1007/978-3-642-54233-6</a><br/>Format: Electronic Resources<br/>The Art of Software Thermal Management for Embedded Systemsent://SD_ILS/0/SD_ILS:198552024-09-06T23:40:49Z2024-09-06T23:40:49ZYazar Benson, Mark. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-0298-9">http://dx.doi.org/10.1007/978-1-4939-0298-9</a><br/>Format: Electronic Resources<br/>