Search Results for System safety. - Narrowed by: Electronics and Microelectronics, Instrumentation. SirsiDynix Enterprise https://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dSystem$002bsafety.$0026qf$003dSUBJECT$002509Konu$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$0026ic$003dtrue$0026ps$003d300? 2024-07-05T04:42:11Z Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:224699 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Birolini, Alessandro. author.<br/><a href="https://doi.org/10.1007/978-3-662-54209-5">https://doi.org/10.1007/978-3-662-54209-5</a><br/>Format:&#160;Electronic Resources<br/> Dependable Multicore Architectures at Nanoscale ent://SD_ILS/0/SD_ILS:225989 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Ottavi, Marco. editor.<br/><a href="https://doi.org/10.1007/978-3-319-54422-9">https://doi.org/10.1007/978-3-319-54422-9</a><br/>Format:&#160;Electronic Resources<br/> Functional Safety for Road Vehicles New Challenges and Solutions for E-mobility and Automated Driving ent://SD_ILS/0/SD_ILS:17840 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Ross, Hans-Leo. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-33361-8">http://dx.doi.org/10.1007/978-3-319-33361-8</a><br/>Format:&#160;Electronic Resources<br/> Bias Temperature Instability for Devices and Circuits ent://SD_ILS/0/SD_ILS:19680 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format:&#160;Electronic Resources<br/> CMOS Test and Evaluation A Physical Perspective ent://SD_ILS/0/SD_ILS:19913 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Bhushan, Manjul. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-1349-7">http://dx.doi.org/10.1007/978-1-4939-1349-7</a><br/>Format:&#160;Electronic Resources<br/> Design for Manufacturability From 1D to 4D for 90&ndash;22 nm Technology Nodes ent://SD_ILS/0/SD_ILS:19593 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format:&#160;Electronic Resources<br/> Proceedings of the First Symposium on Aviation Maintenance and Management-Volume II ent://SD_ILS/0/SD_ILS:23972 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Wang, Jinsong. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-642-54233-6">http://dx.doi.org/10.1007/978-3-642-54233-6</a><br/>Format:&#160;Electronic Resources<br/> The Art of Software Thermal Management for Embedded Systems ent://SD_ILS/0/SD_ILS:19855 2024-07-05T04:42:11Z 2024-07-05T04:42:11Z Yazar&#160;Benson, Mark. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-0298-9">http://dx.doi.org/10.1007/978-1-4939-0298-9</a><br/>Format:&#160;Electronic Resources<br/>