Search Results for Statistics&nbsp;. - Narrowed by: System safety. SirsiDynix Enterprise https://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dStatistics$0025C2$0025A0.$0026qf$003dSUBJECT$002509Konu$002509System$002bsafety.$002509System$002bsafety.$0026ic$003dtrue$0026ps$003d300? 2024-08-05T04:05:35Z 14th International Probabilistic Workshop ent://SD_ILS/0/SD_ILS:223561 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Caspeele, Robby. editor.<br/><a href="https://doi.org/10.1007/978-3-319-47886-9">https://doi.org/10.1007/978-3-319-47886-9</a><br/>Format:&#160;Electronic Resources<br/> Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghian ent://SD_ILS/0/SD_ILS:224208 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Gardoni, Paolo. editor.<br/><a href="https://doi.org/10.1007/978-3-319-52425-2">https://doi.org/10.1007/978-3-319-52425-2</a><br/>Format:&#160;Electronic Resources<br/> Dynamic Modeling of Complex Industrial Processes: Data-driven Methods and Application Research ent://SD_ILS/0/SD_ILS:226390 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Shang, Chao. author.<br/><a href="https://doi.org/10.1007/978-981-10-6677-1">https://doi.org/10.1007/978-981-10-6677-1</a><br/>Format:&#160;Electronic Resources<br/> Risk Based Assessment of Subsynchronous Resonance in AC/DC Systems ent://SD_ILS/0/SD_ILS:221632 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Adrees, Atia. author.<br/><a href="https://doi.org/10.1007/978-3-319-44947-0">https://doi.org/10.1007/978-3-319-44947-0</a><br/>Format:&#160;Electronic Resources<br/> Point Processes for Reliability Analysis Shocks and Repairable Systems ent://SD_ILS/0/SD_ILS:226312 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Cha, Ji Hwan. author.<br/><a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format:&#160;Electronic Resources<br/> Data-Driven Remaining Useful Life Prognosis Techniques Stochastic Models, Methods and Applications ent://SD_ILS/0/SD_ILS:221648 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Si, Xiao-Sheng. author.<br/><a href="https://doi.org/10.1007/978-3-662-54030-5">https://doi.org/10.1007/978-3-662-54030-5</a><br/>Format:&#160;Electronic Resources<br/> Strategies and Techniques for Quality and Flexibility ent://SD_ILS/0/SD_ILS:226833 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Barad, Miryam. author.<br/><a href="https://doi.org/10.1007/978-3-319-68400-0">https://doi.org/10.1007/978-3-319-68400-0</a><br/>Format:&#160;Electronic Resources<br/> The Global Cyber-Vulnerability Report ent://SD_ILS/0/SD_ILS:23480 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Subrahmanian, V.S. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-25760-0">http://dx.doi.org/10.1007/978-3-319-25760-0</a><br/>Format:&#160;Electronic Resources<br/> VoIP and PBX Security and Forensics A Practical Approach ent://SD_ILS/0/SD_ILS:17399 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Androulidakis, Iosif I. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-29721-7">http://dx.doi.org/10.1007/978-3-319-29721-7</a><br/>Format:&#160;Electronic Resources<br/> Industrial Espionage and Technical Surveillance Counter Measurers ent://SD_ILS/0/SD_ILS:17270 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Androulidakis, Iosif. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-28666-2">http://dx.doi.org/10.1007/978-3-319-28666-2</a><br/>Format:&#160;Electronic Resources<br/> Software Fault Detection and Correction: Modeling and Applications ent://SD_ILS/0/SD_ILS:221251 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Peng, Rui. author.<br/><a href="https://doi.org/10.1007/978-981-13-1162-8">https://doi.org/10.1007/978-981-13-1162-8</a><br/>Format:&#160;Electronic Resources<br/> Understanding Modern Dive Computers and Operation Protocols, Models, Tests, Data, Risk and Applications ent://SD_ILS/0/SD_ILS:222654 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Wienke, B. R. author.<br/><a href="https://doi.org/10.1007/978-3-319-94054-0">https://doi.org/10.1007/978-3-319-94054-0</a><br/>Format:&#160;Electronic Resources<br/> Encyclopedia of Social Network Analysis and Mining ent://SD_ILS/0/SD_ILS:19628 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Alhajj, Reda. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-6170-8">http://dx.doi.org/10.1007/978-1-4614-6170-8</a><br/>Format:&#160;Electronic Resources<br/> Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance ent://SD_ILS/0/SD_ILS:226406 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Gheorghe, Adrian V. author.<br/><a href="https://doi.org/10.1007/978-3-319-69224-1">https://doi.org/10.1007/978-3-319-69224-1</a><br/>Format:&#160;Electronic Resources<br/> Data-Driven Prediction for Industrial Processes and Their Applications ent://SD_ILS/0/SD_ILS:221725 2024-08-05T04:05:35Z 2024-08-05T04:05:35Z Yazar&#160;Zhao, Jun. author.<br/><a href="https://doi.org/10.1007/978-3-319-94051-9">https://doi.org/10.1007/978-3-319-94051-9</a><br/>Format:&#160;Electronic Resources<br/>