Search Results for Statistics . - Narrowed by: System safety.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dStatistics$0025C2$0025A0.$0026qf$003dSUBJECT$002509Konu$002509System$002bsafety.$002509System$002bsafety.$0026ic$003dtrue$0026ps$003d300?2024-08-05T04:05:35Z14th International Probabilistic Workshopent://SD_ILS/0/SD_ILS:2235612024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Caspeele, Robby. editor.<br/><a href="https://doi.org/10.1007/978-3-319-47886-9">https://doi.org/10.1007/978-3-319-47886-9</a><br/>Format: Electronic Resources<br/>Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghianent://SD_ILS/0/SD_ILS:2242082024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Gardoni, Paolo. editor.<br/><a href="https://doi.org/10.1007/978-3-319-52425-2">https://doi.org/10.1007/978-3-319-52425-2</a><br/>Format: Electronic Resources<br/>Dynamic Modeling of Complex Industrial Processes: Data-driven Methods and Application Researchent://SD_ILS/0/SD_ILS:2263902024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Shang, Chao. author.<br/><a href="https://doi.org/10.1007/978-981-10-6677-1">https://doi.org/10.1007/978-981-10-6677-1</a><br/>Format: Electronic Resources<br/>Risk Based Assessment of Subsynchronous Resonance in AC/DC Systemsent://SD_ILS/0/SD_ILS:2216322024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Adrees, Atia. author.<br/><a href="https://doi.org/10.1007/978-3-319-44947-0">https://doi.org/10.1007/978-3-319-44947-0</a><br/>Format: Electronic Resources<br/>Point Processes for Reliability Analysis Shocks and Repairable Systemsent://SD_ILS/0/SD_ILS:2263122024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Cha, Ji Hwan. author.<br/><a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Electronic Resources<br/>Data-Driven Remaining Useful Life Prognosis Techniques Stochastic Models, Methods and Applicationsent://SD_ILS/0/SD_ILS:2216482024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Si, Xiao-Sheng. author.<br/><a href="https://doi.org/10.1007/978-3-662-54030-5">https://doi.org/10.1007/978-3-662-54030-5</a><br/>Format: Electronic Resources<br/>Strategies and Techniques for Quality and Flexibilityent://SD_ILS/0/SD_ILS:2268332024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Barad, Miryam. author.<br/><a href="https://doi.org/10.1007/978-3-319-68400-0">https://doi.org/10.1007/978-3-319-68400-0</a><br/>Format: Electronic Resources<br/>The Global Cyber-Vulnerability Reportent://SD_ILS/0/SD_ILS:234802024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Subrahmanian, V.S. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-25760-0">http://dx.doi.org/10.1007/978-3-319-25760-0</a><br/>Format: Electronic Resources<br/>VoIP and PBX Security and Forensics A Practical Approachent://SD_ILS/0/SD_ILS:173992024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Androulidakis, Iosif I. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-29721-7">http://dx.doi.org/10.1007/978-3-319-29721-7</a><br/>Format: Electronic Resources<br/>Industrial Espionage and Technical Surveillance Counter Measurersent://SD_ILS/0/SD_ILS:172702024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Androulidakis, Iosif. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-28666-2">http://dx.doi.org/10.1007/978-3-319-28666-2</a><br/>Format: Electronic Resources<br/>Software Fault Detection and Correction: Modeling and Applicationsent://SD_ILS/0/SD_ILS:2212512024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Peng, Rui. author.<br/><a href="https://doi.org/10.1007/978-981-13-1162-8">https://doi.org/10.1007/978-981-13-1162-8</a><br/>Format: Electronic Resources<br/>Understanding Modern Dive Computers and Operation Protocols, Models, Tests, Data, Risk and Applicationsent://SD_ILS/0/SD_ILS:2226542024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Wienke, B. R. author.<br/><a href="https://doi.org/10.1007/978-3-319-94054-0">https://doi.org/10.1007/978-3-319-94054-0</a><br/>Format: Electronic Resources<br/>Encyclopedia of Social Network Analysis and Miningent://SD_ILS/0/SD_ILS:196282024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Alhajj, Reda. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-6170-8">http://dx.doi.org/10.1007/978-1-4614-6170-8</a><br/>Format: Electronic Resources<br/>Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governanceent://SD_ILS/0/SD_ILS:2264062024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Gheorghe, Adrian V. author.<br/><a href="https://doi.org/10.1007/978-3-319-69224-1">https://doi.org/10.1007/978-3-319-69224-1</a><br/>Format: Electronic Resources<br/>Data-Driven Prediction for Industrial Processes and Their Applicationsent://SD_ILS/0/SD_ILS:2217252024-08-05T04:05:35Z2024-08-05T04:05:35ZYazar Zhao, Jun. author.<br/><a href="https://doi.org/10.1007/978-3-319-94051-9">https://doi.org/10.1007/978-3-319-94051-9</a><br/>Format: Electronic Resources<br/>