Search Results for SpringerLink (Online service) - Narrowed by: Circuits and Systems. - Industrial safety. - Microelectronics.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dSpringerLink$002b$002528Online$002bservice$002529$0026qf$003dSUBJECT$002509Konu$002509Circuits$002band$002bSystems.$002509Circuits$002band$002bSystems.$0026qf$003dSUBJECT$002509Konu$002509Industrial$002bsafety.$002509Industrial$002bsafety.$0026qf$003dSUBJECT$002509Konu$002509Microelectronics.$002509Microelectronics.$0026ps$003d300$0026isd$003dtrue?2024-09-06T13:34:13ZBias Temperature Instability for Devices and Circuitsent://SD_ILS/0/SD_ILS:196802024-09-06T13:34:13Z2024-09-06T13:34:13ZYazar Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodesent://SD_ILS/0/SD_ILS:195932024-09-06T13:34:13Z2024-09-06T13:34:13ZYazar Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:199132024-09-06T13:34:13Z2024-09-06T13:34:13ZYazar Bhushan, Manjul. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-1349-7">http://dx.doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>