Search Results for SpringerLink (Online service) - Narrowed by: Circuits and Systems. - Industrial safety. - Microelectronics. SirsiDynix Enterprise https://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dSpringerLink$002b$002528Online$002bservice$002529$0026qf$003dSUBJECT$002509Konu$002509Circuits$002band$002bSystems.$002509Circuits$002band$002bSystems.$0026qf$003dSUBJECT$002509Konu$002509Industrial$002bsafety.$002509Industrial$002bsafety.$0026qf$003dSUBJECT$002509Konu$002509Microelectronics.$002509Microelectronics.$0026ps$003d300$0026isd$003dtrue? 2024-09-06T13:34:13Z Bias Temperature Instability for Devices and Circuits ent://SD_ILS/0/SD_ILS:19680 2024-09-06T13:34:13Z 2024-09-06T13:34:13Z Yazar&#160;Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-7909-3">http://dx.doi.org/10.1007/978-1-4614-7909-3</a><br/>Format:&#160;Electronic Resources<br/> Design for Manufacturability From 1D to 4D for 90&ndash;22 nm Technology Nodes ent://SD_ILS/0/SD_ILS:19593 2024-09-06T13:34:13Z 2024-09-06T13:34:13Z Yazar&#160;Balasinski, Artur. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-1761-3">http://dx.doi.org/10.1007/978-1-4614-1761-3</a><br/>Format:&#160;Electronic Resources<br/> CMOS Test and Evaluation A Physical Perspective ent://SD_ILS/0/SD_ILS:19913 2024-09-06T13:34:13Z 2024-09-06T13:34:13Z Yazar&#160;Bhushan, Manjul. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-1349-7">http://dx.doi.org/10.1007/978-1-4939-1349-7</a><br/>Format:&#160;Electronic Resources<br/>