Search Results for SpringerLink (Online service) - Narrowed by: Characterization and Evaluation of Materials. - Nanotechnology.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dSpringerLink$002b$002528Online$002bservice$002529$0026qf$003dSUBJECT$002509Konu$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$0026qf$003dSUBJECT$002509Konu$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026ps$003d300?2024-09-07T04:38:39ZNanomechanical Analysis of High Performance Materialsent://SD_ILS/0/SD_ILS:252232024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Tiwari, Atul. editor.<br/><a href="http://dx.doi.org/10.1007/978-94-007-6919-9">http://dx.doi.org/10.1007/978-94-007-6919-9</a><br/>Format: Electronic Resources<br/>Trends in Nanoscale Mechanics Mechanics of Carbon Nanotubes, Graphene, Nanocomposites and Molecular Dynamicsent://SD_ILS/0/SD_ILS:254632024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Harik, Vasyl. editor.<br/><a href="http://dx.doi.org/10.1007/978-94-017-9263-9">http://dx.doi.org/10.1007/978-94-017-9263-9</a><br/>Format: Electronic Resources<br/>Advanced Packaging and Manufacturing Technology Based on Adhesion Engineering Wafer-Level Transfer Packaging and Fabrication Techniques Using Interface Energy Control Methodent://SD_ILS/0/SD_ILS:2234572024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Seok, Seonho. author.<br/><a href="https://doi.org/10.1007/978-3-319-77872-3">https://doi.org/10.1007/978-3-319-77872-3</a><br/>Format: Electronic Resources<br/>Comparators in Nanometer CMOS Technologyent://SD_ILS/0/SD_ILS:245072024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Goll, Bernhard. author.<br/><a href="http://dx.doi.org/10.1007/978-3-662-44482-5">http://dx.doi.org/10.1007/978-3-662-44482-5</a><br/>Format: Electronic Resources<br/>Polymer Engineering Science and Viscoelasticity An Introductionent://SD_ILS/0/SD_ILS:198322024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Brinson, Hal F. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4899-7485-3">http://dx.doi.org/10.1007/978-1-4899-7485-3</a><br/>Format: Electronic Resources<br/>RHEED Transmission Mode and Pole Figures Thin Film and Nanostructure Texture Analysisent://SD_ILS/0/SD_ILS:197672024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Wang, Gwo-Ching. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-9287-0">http://dx.doi.org/10.1007/978-1-4614-9287-0</a><br/>Format: Electronic Resources<br/>Micro-scaled Products Development via Microforming Deformation Behaviours, Processes, Tooling and its Realizationent://SD_ILS/0/SD_ILS:195232024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Fu, Ming Wang. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4471-6326-8">http://dx.doi.org/10.1007/978-1-4471-6326-8</a><br/>Format: Electronic Resources<br/>Poly-SiGe for MEMS-above-CMOS Sensorsent://SD_ILS/0/SD_ILS:252072024-09-07T04:38:39Z2024-09-07T04:38:39ZYazar Gonzalez Ruiz, Pilar. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-6799-7">http://dx.doi.org/10.1007/978-94-007-6799-7</a><br/>Format: Electronic Resources<br/>