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2024-10-01T12:02:45Z
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:25330
2024-10-01T12:02:45Z
2024-10-01T12:02:45Z
Yazar Franco, Jacopo. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-7663-0">http://dx.doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>
Poly-SiGe for MEMS-above-CMOS Sensors
ent://SD_ILS/0/SD_ILS:25207
2024-10-01T12:02:45Z
2024-10-01T12:02:45Z
Yazar Gonzalez Ruiz, Pilar. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-6799-7">http://dx.doi.org/10.1007/978-94-007-6799-7</a><br/>Format: Electronic Resources<br/>
Lasers with Nuclear Pumping
ent://SD_ILS/0/SD_ILS:21251
2024-10-01T12:02:45Z
2024-10-01T12:02:45Z
Yazar Melnikov, S.P. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-08882-2">http://dx.doi.org/10.1007/978-3-319-08882-2</a><br/>Format: Electronic Resources<br/>