Search Results for SpringerLink (Online service) - Narrowed by: English - TEDU library - Document Preparation and Text Processing. - Pattern recognition.SirsiDynix Enterprisehttps://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dSpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026qf$003dLIBRARY$002509K$0025C3$0025BCt$0025C3$0025BCphane$0025091$00253ATEDU$002509TEDU$002blibrary$0026qf$003dSUBJECT$002509Konu$002509Document$002bPreparation$002band$002bText$002bProcessing.$002509Document$002bPreparation$002band$002bText$002bProcessing.$0026qf$003dSUBJECT$002509Konu$002509Pattern$002brecognition.$002509Pattern$002brecognition.$0026ic$003dtrue$0026ps$003d300?2024-09-08T04:54:11ZComputational Forensics 5th International Workshop, IWCF 2012, Tsukuba, Japan, November 11, 2012 and 6th International Workshop, IWCF 2014, Stockholm, Sweden, August 24, 2014, Revised Selected Papersent://SD_ILS/0/SD_ILS:230192024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Garain, Utpal. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-20125-2">http://dx.doi.org/10.1007/978-3-319-20125-2</a><br/>Format: Electronic Resources<br/>Handbook of Document Image Processing and Recognitionent://SD_ILS/0/SD_ILS:192712024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Doermann, David. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-85729-859-1">http://dx.doi.org/10.1007/978-0-85729-859-1</a><br/>Format: Electronic Resources<br/>Camera-Based Document Analysis and Recognition 5th International Workshop, CBDAR 2013, Washington, DC, USA, August 23, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:206182024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Iwamura, Masakazu. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-05167-3">http://dx.doi.org/10.1007/978-3-319-05167-3</a><br/>Format: Electronic Resources<br/>Graphics Recognition. Current Trends and Challenges 10th International Workshop, GREC 2013, Bethlehem, PA, USA, August 20-21, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:245672024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Lamiroy, Bart. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-662-44854-0">http://dx.doi.org/10.1007/978-3-662-44854-0</a><br/>Format: Electronic Resources<br/>Pattern Recognition 6th Chinese Conference, CCPR 2014, Changsha, China, November 17-19, 2014. Proceedings, Part IIent://SD_ILS/0/SD_ILS:246612024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Li, Shutao. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-662-45643-9">http://dx.doi.org/10.1007/978-3-662-45643-9</a><br/>Format: Electronic Resources<br/>Pattern Recognition 6th Chinese Conference, CCPR 2014, Changsha, China, November 17-19, 2014. Proceedings, Part Ient://SD_ILS/0/SD_ILS:246622024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Li, Shutao. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-662-45646-0">http://dx.doi.org/10.1007/978-3-662-45646-0</a><br/>Format: Electronic Resources<br/>Advanced Machine Learning Technologies and Applications Second International Conference, AMLTA 2014, Cairo, Egypt, November 28-30, 2014. Proceedingsent://SD_ILS/0/SD_ILS:220892024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Hassanien, Aboul Ella. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-13461-1">http://dx.doi.org/10.1007/978-3-319-13461-1</a><br/>Format: Electronic Resources<br/>Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedingsent://SD_ILS/0/SD_ILS:229322024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Paredes, Roberto. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-19390-8">http://dx.doi.org/10.1007/978-3-319-19390-8</a><br/>Format: Electronic Resources<br/>Advances in Speech and Language Technologies for Iberian Languages Second International Conference, IberSPEECH 2014, Las Palmas de Gran Canaria, Spain, November 19-21, 2014. Proceedingsent://SD_ILS/0/SD_ILS:221112024-09-08T04:54:11Z2024-09-08T04:54:11ZYazar Navarro Mesa, Juan Luis. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-319-13623-3">http://dx.doi.org/10.1007/978-3-319-13623-3</a><br/>Format: Electronic Resources<br/>