Search Results for Reliability. - Narrowed by: Electronic Book - Electronic materials. SirsiDynix Enterprise https://catalog.tedu.edu.tr/client/tr_TR/defaulttr/defaulttr/qu$003dReliability.$0026qf$003dITYPE$002509Materyal$002bT$0025C3$0025BCr$0025C3$0025BC$0025091$00253AE-BOOKS$002509Electronic$002bBook$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bmaterials.$002509Electronic$002bmaterials.$0026ps$003d300$0026isd$003dtrue? 2024-08-02T12:57:05Z Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability ent://SD_ILS/0/SD_ILS:19955 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;El-Kareh, Badih. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4939-2751-7">http://dx.doi.org/10.1007/978-1-4939-2751-7</a><br/>Format:&#160;Electronic Resources<br/> Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications ent://SD_ILS/0/SD_ILS:25330 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;Franco, Jacopo. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-7663-0">http://dx.doi.org/10.1007/978-94-007-7663-0</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability ent://SD_ILS/0/SD_ILS:19764 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;Lee, Tae-Kyu. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-9266-5">http://dx.doi.org/10.1007/978-1-4614-9266-5</a><br/>Format:&#160;Electronic Resources<br/> Reliable Design of Electronic Equipment An Engineering Guide ent://SD_ILS/0/SD_ILS:21288 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;Natarajan, Dhanasekharan. author.<br/><a href="http://dx.doi.org/10.1007/978-3-319-09111-2">http://dx.doi.org/10.1007/978-3-319-09111-2</a><br/>Format:&#160;Electronic Resources<br/> Introduction to Semiconductor Lasers for Optical Communications An Applied Approach ent://SD_ILS/0/SD_ILS:19775 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;Klotzkin, David J. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-9341-9">http://dx.doi.org/10.1007/978-1-4614-9341-9</a><br/>Format:&#160;Electronic Resources<br/> Copper Wire Bonding ent://SD_ILS/0/SD_ILS:19627 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;Chauhan, Preeti S. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-5761-9">http://dx.doi.org/10.1007/978-1-4614-5761-9</a><br/>Format:&#160;Electronic Resources<br/> Thermal Management for LED Applications ent://SD_ILS/0/SD_ILS:19620 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;Lasance, Clemens J.M. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4614-5091-7">http://dx.doi.org/10.1007/978-1-4614-5091-7</a><br/>Format:&#160;Electronic Resources<br/> Poly-SiGe for MEMS-above-CMOS Sensors ent://SD_ILS/0/SD_ILS:25207 2024-08-02T12:57:05Z 2024-08-02T12:57:05Z Yazar&#160;Gonzalez Ruiz, Pilar. author.<br/><a href="http://dx.doi.org/10.1007/978-94-007-6799-7">http://dx.doi.org/10.1007/978-94-007-6799-7</a><br/>Format:&#160;Electronic Resources<br/>